BEGIN:VCALENDAR
VERSION:2.0
PRODID:Icfo
X-PUBLISHED-TTL:P1W
BEGIN:VEVENT
UID:69f420c80ab04
DTSTART:20260520T100000Z
SEQUENCE:0
TRANSP:OPAQUE
DTEND:20260520T110000Z
LOCATION:Seminar Room
SUMMARY:ICFO | MARINOS DIMITROPOULOS
CLASS:PUBLIC
DESCRIPTION:Atomic force microscopy (AFM) is often introduced as a tool for
  nanoscale topography\, but its real strength lies in how broadly the prob
 e can be repurposed to interrogate functional materials and interfaces. Be
 yond conventional imaging and electrical modes\, advanced AFM-based techni
 ques can access local electrochemical activity\, mechanical response and e
 ven chemical fingerprints with nanometre-scale resolution.\nIn this semina
 r\, I will present a practical overview of advanced AFM modes that extend 
 the technique from surface imaging to a multimodal nanoscale characterizat
 ion platform. I will focus on nanopipette methods such as Scanning Ion Con
 ductance Microscopy (SICM) and Scanning Electrochemical Cell Microscopy (S
 ECCM)\, electrochemical AFM (EC AFM)\, nanomechanical measurements based o
 n nanoindentation\, and tip-enhanced Raman spectroscopy (TERS). Together\,
  these approaches enable the study of materials in liquid environments and
  under bias\, providing access to structure-property relationships that ar
 e difficult to obtain with conventional microscopy alone.\nI will also bri
 efly discuss complementary directions including scanning thermal microscop
 y (SThM) and high-speed AFM imaging\, which further expand the AFM toolbox
  towards dynamic nanoscale phenomena. The goal of the talk is to show how 
 advanced AFM can be used not simply to image surfaces\, but to probe funct
 ional and transforming surfaces across electrochemistry\, nanofabrication\
 , and materials research.
DTSTAMP:20260501T034056Z
END:VEVENT
END:VCALENDAR